Software

layers thickness from TEM

Batch fitting of layers thickness from (TEM) images.

TEM micrograph by dr hab. inż. Jolanta Borysiuk

plot of reflectivity in function of sample growth

Simulation of reflectivity during sample growth.
reflectivity of a sample

Simulation of reflectivity in the entire visible spectrum.

reflectivity of a sample

Samples schematics in blender.
reflectivity of a sample

Batch fitting of excitation lifetime.

sample overview

Sample overview

fitting one mode for the entire sample

One-mode fitting

fitting two spectrally close modes

Two-mode fitting

© Maciej Ściesiek 2017-2018. All rights reserved.