Here you can see the setup for optical preview of the sample. The preview was intended to be placed on a optical bench. The main objective was to make it quite compact and easy to use (no need to adjust anything between uses).

schematic of a preview

A view on a preview setup designed in 'Autodesk Inventor'.

The setup uses mostly thorlabs 30 mm cage system, but there are also a few elements that I had to order on our faculty's mechanical workshop (shown above in red). The setup comprises of:

Below you can see the testing phase of the setup: no custom parts and a second pelicle instead of a polca dot. It is a proof of concept and works well. However the second pelicle reflects very little light and a polca dot is needed to shine more light on the samples surface (and therfore to better see the sample surface).

Testing of a preview setup

Testing the preview without the custom made elements.

Testing of a preview setup - another view

Another look at the test unit.

Why would you even want to use such a setup? Imagine that you are investigating small features on the sample, like a micropillar (SEM micrograph shown below) or a very small flake of some dichalcogenides. You would like to focus laser on such an object.

A 2um micropillar

A scanning electron microscope picture of a 2 um micropillar on which we would like to focus our laser spot.

The problem is that it is very hard to find such features on the sample. Below is placed a SEM micrograph of the sample with micropillars). Without the preview setup it is virtually imposible to find the micropillars during measurements...

The micropillars from far

A micropillars array (in the middle) seen from far. Not so easy to find them on a large sample...

Finally, below you can see the image as seen by a ccd camera of the preview setup. Here you can see a 10-um micropillar with a green laser spot over it. As you can see, finding your micropillar is not that hard anymore.

A view on a micropillar

A laser spot on a 10-um diameter micropillar.